Atom-scale metrology at industrial scale throughput

Nearfield Instruments is a disruptive semiconductor metrology and inspection company able to increase yield for production of increasingly complex chips. Nearfield’s technology is based on an ultrafast High-Throughput Atomic Force Microscopy (HT-AFM) system capable of non-destructive measurements of complex 3D and high aspect ratios for high volume production. Hereby, Nearfield is enabling the next-generation integrated circuits and applications.